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Rapid development of ferroelectric-based devices with reduced dimensions generated a strong need for extensive investigation of the size effects in these materials. This paper considers recent progress in application of the advanced modes of piezoresponse force microscopy (PFM), such as such as resonance-enhanced PFM, stroboscopic PFM and switching spectroscopy PFM, to investigation of the static and dynamic properties of nanoscale ferroelectric structures.
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Alexei Gruverman (2012) studied this question.
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