Because of the interaction between self-heating and hot carriers effects, neither isothermal nor conventional macrothermal models are adequate for the simulation of state-of-the-art power devices; instead, a detailed electro-thermal model accounting for nonstationary transport, such as the Thermal-Fully Hydrodynamic (T-FH) model, is required. We apply a one-dimensional (1-D) implementation of such a model to the simulation of AlGaAs/GaAs and InP/InGaAs Heterojunction Bipolar Transistors (HBTs), comparing the results with those provided by simplified models, and highlighting how deeply both nonlocal transport and self-heating affect the predicted device performance. The importance of the convective terms is assessed, and a new nonthermal mechanism for the output Negative Differential Resistance (NDR) is proposed.
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Benvenuti et al. (1997) studied this question.
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