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July 14, 1997Applied Physics Letters

Optical system for rapid materials characterization with the transient grating technique: Application to nondestructive evaluation of thin films used in microelectronics

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Authors

John A. Rogers
John A. RogersElectrophysiologyMFMartin FuchsTU WienMBMatthew J. Banet

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Rogers et al. (1997) studied this question.

synapsesocial.com/papers/6a962acb35b526a38ffa04a7https://doi.org/10.1063/1.119506
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