Answers are grounded in this paper and cite their sources.
Data on niobium sputtered films obtained by different techniques are presented and discussed. The residual resistivity is shown to be determined by grain boundary scattering. It is then proven that, also in this case, the residual resistivity behaves as a ``universal'' parameter determining the detailed superconducting properties of the films. The effect of film nonuniformity in the growth direction is also discussed.
No takes yet. Share an insight, caveat, or question.
Andreone et al. (1995) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: