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February 1, 1996Journal of Electron Microscopy

Imaging of Transition Radiation from Thin Films on a Silicon Substrate Using a Light Detection System Combined with TEM

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Authors

NYNaoki YamamotoTokyo Institute of TechnologyATAkio TodaNEC (Japan)KAK. AxayaTokyo Institute of Technology

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Cite This Study

Yamamoto et al. (1996) studied this question.

synapsesocial.com/papers/6a969a92a45595e5080e2e9bhttps://doi.org/10.1093/oxfordjournals.jmicro.a023414
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