Experimental and Monte Carlo analysis of near-breakdown phenomena in GaAs-based heterostructure FETs, A Sleiman, A Di Carlo, L Tocca, P Lugli, G Zandler, G Meneghesso, E Zanoni, C Canali, A Cetronio, M Lanzieri, M Peroni
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Sleiman et al. (2001) studied this question.
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