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Step-chirped phase masks for step-chirped fiber Bragg gratings (FBGs) were fabricated by employing a new writing strategy, in which the beam is able to scan a step-chirped pattern all at once or continuously. This new writing strategy was realized by using a raster scan-type laser-beam writing system. Linearly and nonlinearly step-chirped FBGs, fabricated by using these masks, show very low group-delay ripple characteristics, which means that the masks have fewer stitching errors than conventional step-chirped masks.
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Komukai et al. (2002) studied this question.
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