Measurements of the quantized Hall resistance R H (i) (i = 2 or 4) in 7 different heterostructures (six GaAs based, one InP based) are reported. R H (i) is measured in terms of Ω LCIE by means of a resistance-ratio measurement bridge using a cryogenic current comparator. The peak-to-peak scatter of the results is 8.5 × 10 -8 . An estimation of R H (i = 2) in terms of Ω LCIE is given with a 1 σ (one standard deviation) total uncertainty of 2.2 × 10 -8 .
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Delahaye et al. (1986) studied this question.
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