A Graph Theory-Based Automated Twin Recognition Technique for Electron Backscatter Diffraction Analysis

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The present article introduces a new software, Microstructure Evaluation Tool for Interface Statistics (METIS), that performs high-throughput microstructure statistical analysis from electron backscatter diffraction maps. Emphasis is placed on the detection of twin domains in hexagonal close-packed metals. The numerical framework on which METIS is built leverages graph theory, group structures, and associated numerical algorithms to automatically detect twins and unravel both their intrinsic characteristics features and those pertaining to their interactions. The proposed graphical interface allows for the detection and correction of unlikely twin/parent associations rendering the approach applicable to highly deformed microstructures. Twin statistics and microstructural data are classified and saved in a relational database that can be interrogated via either GUI or SQL requests to reveal a wide spectrum of features of the microstructure. Illustration of the approach is performed in the case of zirconium.