We present a semianalytical model for the electrostatics and the current-voltage characteristics of Macaroni MOSFETs based on the exact solution of the Poisson equation, which is useful to investigate both the subthreshold and the ON-state regimes of these devices. With the addition of a simplified calculation of the tunneling current, the model is exploited to analyze the program performance of Macaroni NAND flash memories.
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Paolucci et al. (2016) studied this question.
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