Micron (Italy)

Recent papers from Micron (Italy)

1. Spectral Selectivity Enhancement in Solar Absorber Multilayers through Titanium Oxynitride Thin Film ModulationAdvanced Optical Materials · 2026
2. Microscopic model of the operation of the single-chalcogenide X-point memoryCommunications Materials · 2026
3. Graphene and Ti 3 C 2 T x MXene Nanomaterial-Infused Bioinks for Mechanical and Electrical Improvement of 3D Bioprinted ScaffoldsACS Applied Bio Materials · 2026
4. Additively Manufactured Bioreactors for Scaffold-Coupled Electrical StimulationACS Applied Bio Materials · 2026
5. 3-D Crosspoint (3DXP) Memory Arrays With Subthreshold Operation for Low-Energy, High-Accuracy Neural Network AcceleratorsIEEE Transactions on Electron Devices · 2025
6. Variability in Wood Quality and Moisture Content Measured by an Industrial X-Ray Scanner Across 700,000 Sawlogs of Picea abies, Abies alba, and Pinus sylvestrisForests · 2025
7. Direct Scaffold-Coupled Electrical Stimulation of Chondrogenic Progenitor Cells through Graphene Foam Bioscaffolds to Control the Mechanical Properties of Graphene Foam–Cell CompositesACS Applied Materials & Interfaces · 2025
8. X-Ray Effects on Alpha-Induced Soft Error Rate in 3-D NAND Replacement Gate Flash Memory CellsIEEE Transactions on Nuclear Science · 2025
9. Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional nand Flash MemoriesMicromachines · 2024
10. Total-Dose-Induced Threshold Voltage Shift Dependence on Tier Pitch in 3-D nand Flash MemoriesIEEE Transactions on Nuclear Science · 2024
11. High density VCM deformable mirror2024
12. GMT ASM overview and status2024
13. Evidence of Widely Distributed Time Constants in the Vertical Charge Loss of 3-D Charge-Trap NAND Flash MemoriesIEEE Electron Device Letters · 2024
14. Observation of Positive Trap Charge by Electron Holography in PMOS DeviceMicroscopy Today · 2024
15. On Key–Value Sort With Active Compute MemoryIEEE Transactions on Computers · 2024
16. 13.7 A 1Tb Density 3b/Cell 3D-NAND Flash on a 2YY-Tier Technology with a 300MB/s Write Throughput2024
17. Impact of Tier Pitch Scaling on Heavy-Ion Sensitivity of 3-D NAND Flash MemoriesIEEE Transactions on Nuclear Science · 2024
18. A typical postwar workshop: Insights into Simon Hantaï’s oil paint paletteJournal of Cultural Heritage · 2024
19. Depth Dependence of Neutron-Induced Errors in 3-D NAND Floating Gate CellsIEEE Transactions on Nuclear Science · 2023
20. Total Ionizing Dose Effects in 3-D NAND Replacement Gate Flash Memory CellsIEEE Transactions on Nuclear Science · 2023