Answers are grounded in this paper and cite their sources.
Quality factor variation with top electrode area in thin-film barium-strontium-titanate parallel-plate capacitors is discussed. At low frequencies, the geometry dependence is consistent with the presence of a parallel parasitic loss pathway enabled by conduction over the device mesa surface. At high frequencies, the variation in the quality factor with top electrode area is due to a geometry-independent series resistance
No takes yet. Share an insight, caveat, or question.
Pervez et al. (2007) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: