Heavy ion-induced single events transients (SETs) in advanced digital circuits are becoming a significant reliability issue for space-based systems. In this work, two experiments are performed on devices designed to look specifically at digital single event transients. Small voltage variations, like those that can be found across an integrated circuit, are shown to affect the digital single event transient response significantly. For technologies with supply voltages near 1 V, these potential variations may result in unexpected vulnerability.
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Gadlage et al. (2007) studied this question.
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