The first double-crystal topographic studies of epitaxial layers of ZnxCd1−xTe (0≤x≤0.06) grown by molecular beam epitaxy are reported in this letter. A comparison of bulk and epitaxially grown ZnCdTe clearly indicates that the epitaxial layers are of better structural quality and are more suitable for use as substrates for growth of HgCdTe.
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Qadri et al. (1986) studied this question.
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