Space-charge-limited conductivity and mobility measurements in cadmium telluride thin films

It has previously been shown that in thin films showing space-charge-limited conductivity controlled by an exponential trap distribution, the mobility may be unambiguously determined by measuring current density as a function of inverse temperature at constant applied voltage. Moreover, parameters of the trap distribution may be derived independently of the J–V characteristics. It was found that mobilities varied in the range (4–8) × 10-2m2V-1s-1 and that other parameters were consistent with those derived from J–V measurements.