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Starting from the circular symmetric Gaussian statistics describing fully developed speckle patterns, we calculate the absolute measuring error in two-wavelength rough-surface interferometry (ROSI) and discuss its dependency on the ratio between surface roughness and effective wavelength and on the precision of the measurement equipment. We show that in certain circumstances this error can be minimized by the proper choice of the effective wavelength.
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U. Vry (1986) studied this question.
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