In complementary metal oxide semiconductor (CMOS) the power dissipation predominantly comprises of dynamic as well as static power. Prior to introduction of "Deep submicron technologies" it is observed that in case of technology process with feature size larger than 1micro meter, the consumption of dynamic power out of the overall power consumption of any circuit is more than 90%,while that of static power is negligible. But in the present deep submicron technologies in order to, reduce the dynamic power consumption in VLSI circuits, the power supply is being scaled down, keeping in view the principle that the dynamic power dissipated is directly proportional to the square of the supply voltage (Vdd).The threshold voltage also needs to be reduced since the supply voltage is scaled down. Overcoming the inherent limitations in the existing method for leakage power reduction, The Lector (Leakage controlled transistor) technique which works efficiently both in active and idle states of the circuit and results in better leakage power reduction is now proposed. The proposed system presents the analysis of power on "64-bit SRAM array using leakage controlled transistor technique".
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Alekhya et al. (2017) studied this question.
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