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The luminescence properties of zinc oxide (ZnO) films prepared by pulsed laser deposition were investigated by photoluminescence spectroscopy. Films of different thicknesses were deposited on silicon, glass, and sapphire substrates. The visible luminescence spectrum is dependent on film thickness: both the number of peaks and their peak positions varied systematically as a function of film thickness. However, the variations in the luminescence spectra were caused by optical interference in the film/substrate systems. Any effort to determine the mechanisms responsible for the visible luminescence must properly account for these interference effects. Luminescence spectra free of distortion can be obtained from ZnO films thinner than 70nm or much thicker than 1.5μm.
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Wang et al. (2006) studied this question.
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