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A low-noise multibit sigma-delta analog-to-digital converter (ADC) architecture suitable for operation at low oversampling ratios is presented. The ADC architecture uses an efficient high-resolution pipelined quantizer while avoiding loop stability degradation caused by pipeline latency. A 16-b implementation of the architecture, fabricated in a 0.6-/spl mu/m CMOS process, cascades a second-order 5-b sigma-delta modulator with a four-stage 12-b pipelined ADC and operates at a low 8X oversampling ratio. Static and dynamic linearity of the integrated ADC are improved through the use of dynamic element matching techniques and the use of bootstrapped and clock-boosted input switches. The ADC operates at a 20 MHz clock rate and dissipates 550 mW with a 5 V/3 V analog/digital supply. It achieves an SNR of 89 dB over a 1.25-MHz signal bandwidth and a total harmonic distortion (THD) of -98 dB with a 100-kHz input signal.
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Brooks et al. (1997) studied this question.
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