Image-based compensation of dynamic effects in scanning tunnelling microscopes

In this paper, we address the problems associated with the identification and compensation of adverse dynamic effects (magnitude and phase distortions) that limit the operating speed in currently available scanning tunnelling microscopes (STMs). To minimize errors caused by dynamic effects, current STM systems are operated at relatively low speeds (scan frequencies) when compared to the first resonant frequency of the system. Low operating speed limits the temporal resolution of STMs, which in turn limits the STM’s ability to observe fast surface phenomena, and reduces the throughput of STM-based applications such as nanofabrication. Our main contribution is the development of an image-based approach that exploits the extant imaging capabilities of the STM to identify and compensate for errors caused by unwanted dynamic effects, thereby enabling high-speed STM operation. The proposed image-based method is illustrated by applying it to an experimental STM.