Investigations have been made on the temperature dependence of dielectric constant in rapidly quenched amorphous samples of PbTiO3. In the first heating process, discontinuous change in dielectric constant has been observed when the sample crystallizes. Near the crystallization temperature it shows remarkable low frequency dispersion. By annealing samples above the crystallization temperature, the change in dielectric constant caused by the structural realxation toward the perfect crystalline state have been observed.
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Takashige et al. (1980) studied this question.
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