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Carbon-nanotube (CNT)-reinforced indium tin oxide (ITO) films have been fabricated on polyethylene terephthalate substrates by sputter deposition of ITO onto spin-coated multiwalled CNTs. The bending electrical stability of the films was investigated. When bent to a curvature radius of 1.5mm, unreinforced film surface resistance increased by more than 100 times, while the resistance of CNT-reinforced films remained constant. Scanning electron microscopy of the films after bending revealed significant cracking and delamination in the unreinforced ITO films, while the CNT-reinforced films remained substantially intact. These results suggest that CNTs may prevent percolating clusters of defects in films under stress.
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Chiba et al. (2008) studied this question.
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