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May 1, 1972Applied Optics

Ellipsometer Data Analysis with a Small Programmable Desk Calculator

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ARAlan R. Reinberg

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Alan R. Reinberg (1972) studied this question.

synapsesocial.com/papers/6a9e048a549d53af5cf6cb00 https://doi.org/10.1364/ao.11.001273

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Also Consider

Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context:

1Determination of the Properties of Films on Silicon by the Method of Ellipsometry1962 · 254 citations
2Ellipsometry in the Measurement of Surfaces and Thin Films1965 · 207 citations
3Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry1963 · 618 citations
4Ellipsometer Study of Anomalous Absorption in Very Thin Dielectric Films on Evaporated Metals*1966 · 22 citations