The effect of oxygen partial pressure on the properties of thin films produced by sputtering at room temperature aimed at thin film transistor (TFT) application is reported in this work. When produced in the absence of oxygen, the films are polycrystalline, while in the presence of oxygen, the films are amorphous. The films' resistivity is tuned between and . Moreover, the films present a high transmittance and a smooth surface . The high performance as-produced transistors present high saturation mobility and a subthreshold gate-voltage swing of 0.51 V/dec, which is reduced to 0.27 V/dec after annealing.
No takes yet. Share an insight, caveat, or question.
Gonçalves et al. (2009) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: