In situ synchrotron x-ray photon beam characterization

We have investigated two in situ methods of measuring x-ray beam parameters such as integrated intensity, position, and intensity distribution. These virtually transparent methods both rely on the collection of scattered radiation from a thin amorphous foil. The scattered radiation is collected by an active pixel sensor placed below the foil, well out of the direction of the beam path. These methods measure a cross-sectional image of the beam as opposed to a profile or beam centroid position provided by existing in situ detection methods. We present the results of measurements taken at a third generation synchrotron radiation source and provide analytical methods of deriving beam profile, position, and absolute intensity.