Quantifying nano‐domain size and orientation in relaxor ferroelectrics using transmission electron microscopy

Ferroelectric materials contain regions of uniform electrical polarization, known as domains. In Pb‐based relaxor‐ferroelectric perovskite oxides, these domains can be as small as a few nanometers, making standardized analysis of domain sizes challenging. Here, we present two methods for the quantitative analysis of domain sizes from transmission electron micrographs. One method uses statistical analysis of multiple line profiles, and the other analyses the intensity of streaks in the Fourier transform of the image. The techniques provide equivalent results for bright‐field images free of other microstructure or aberrations, while the Fourier method is much simpler to apply.