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April 24, 2008Applied Optics

Three-dimensional particle tracking with subnanometer resolution using off-focus images

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Authors

ZZZhipeng ZhangSun Yat-sen UniversityCMChia-Hsiang MenqCaterpillar (United States)

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Cite This Study

Zhang et al. (2008) studied this question.

synapsesocial.com/papers/6a9ec5cd6e3e9028e6be7000https://doi.org/10.1364/ao.47.002361
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