The influence of electrode temperature on the time delay of electrical breakdown in an argon-filled (13.3 mbar) diode at electrode temperatures of 300, 523 and 673K has been investigated by measuring the electrical breakdown time delay (t d ) dependence on both the time interval between two successive measurements ( tau ) ('memory curves') and the applied voltages (U w ). The results obtained show that values of t d at 673K are about one order of magnitude smaller than those at 300K, whether cathode or anode was heated. It was shown that the complete curve t d =f(U w ) moved towards smaller values of t d with increasing temperature. Conclusions on the change with temperature of the temperature equilibrium concentration of metastables are drawn.
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Pejović et al. (1981) studied this question.
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