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As-grown superconducting YBa2Cu3O7−y thin films with various thicknesses were successfully grown on lattice-matched NdGaO3 substrates by ArF laser ablation deposition. An as-grown 2000-Å-thick film has a zero-resistance temperature (Tc) at 90 K and a 170-Å-thick film has a Tc at 88 K. The existence of a thin interfacial diffusion layer between a 170-Å-thick film and the substrate was observed by Auger electron spectroscopy. Rutherford backscattering spectroscopy suggest that as-grown YBa2Cu3O7−y films on NdGaO3 substrates are high-quality crystals. It is demonstrated that the NdGaO3 has considerable potential as an electronic substrate material by less interfacial diffusion layer and good crystallinity of grown thin films.
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Mukaida et al. (1991) studied this question.
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