Experimental full-solid-angle substrate photoelectron-diffraction data at 1-keV energies: Implications for photoelectron holography

Experimental photoelectron distributions of Al 2s emission above Al(001) and Pt 4f emission above Pt(110) are presented, measured over much of 2{π} solid angle at high angular resolution. These intensity maps illustrate very clearly the relative importance of various scattering processes. In addition to forward scattering along high-density atomic chains, concentration of photoelectron flux along dense atomic planes is observed. Al 2s and Pt 4f exhibit very similar intensity patterns associated with equivalent low-index directions. Holographic information about atomic positions within the nearest-neighbor shell around emitter atoms is found to be contained in circular interference fringes in the vicinity of 〈011〉 forward-scattering directions.