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In an effort to develop a simple low-temperature high-performance polysilicon thin-film transistor (TFT) technology, we report a fabrication process featuring laser-crystallized sputtered-silicon films. This top Al-gate coplanar TFT process subjects the substrate to a maximum temperature of 300/spl deg/C, and produces devices with mobilities up to 450 cm/sup 2//Vs, on/off current ratios greater than 10/sup 7/, without using a post-hydrogenation step. We believe these results represent the highest performance TFT's to date fabricated from sputtered silicon films.
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Giust et al. (1998) studied this question.
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