Studies on forming gas annealing treated BiFeO3 thin films and capacitors

The structure and electric properties of BiFeO3(BFO)∕BaPbO3(BPO) and Pt/BFO/BPO capacitors with forming gas annealing (FGA) treatment were investigated. X-ray diffraction patterns indicated that the annealing did not affect the structure and phase of BFO films. A degraded electric property was obtained in FGA-treated Pt/BFO/BPO films. It can be attributed to the formation of reduction and incomplete reduction of Bi+3 of BFO. Retention and fatigue properties were obtained in FGA-treated BPO/BFO/BPO capacitors. The normalized Pr loss was 22.8% after applying a voltage above 2Vc (coercive voltage) with 1011cycles. The retention behavior within 30000s is governed by the logarithmic time dependence.