In this paper a DC thermal model of Carbon Nanotube Field Effect Transistors (CNTFETs) is proposed. In particular we improve the semi-empirical model, already proposed by us, considering the temperature variation in the Landauer formula for the drain-source current. To confirm the validity of the proposed thermal model, the simulations are performed in different thermal conditions, obtaining I-V characteristics perfectly coincident with those of the Stanford-Source Virtual Carbon Nanotube Field-Effect Transistor model (VS-CNFET), but with a run time lower. This result makes the proposed model particularly suitable to be implemented in CAD applications.
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Marani et al. (2016) studied this question.
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