It is shown that measurements of the temperature dependence of the transient intensity of luminescence afterglow sampled at several points in time after the sudden stop of excitation serve as a reproducible and accurate experimental method to investigate traps in luminescent materials which can be superior to the prevailing thermo-luminescence method. An experimental result on Y2O2S activated by Eu3+ is presented as a practical example of this method.
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Eiichiro Nakazawa (1984) studied this question.
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