Pixels in both hybridized and monolithic complementary metal-oxide semiconductor (CMOS) detector arrays may couple capacitively to their neighboring pixels. This "interpixel capacitance" can significantly distort the characterization of conversion efficiency and modulation transfer function (MTF) in CMOS devices. These effects have been largely unaccounted for in measurements to date. In this work, the effects of this coupling are investigated. Compensation methods for these errors are described and applied to silicon P-I-N array measurements. The measurement of Poisson noise, traditionally done by finding the mean square difference in a pair of images, needs to be modified to include the mean square correlation of differences with neighboring pixels.
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Andrew C. Moore (2006) studied this question.
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