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September 15, 2002Japanese Journal of Applied PhysicsOpen Access

Correlation between Film Thickness and Critical Current Density of Sm1+xBa2-xCu3O6+δ Films Deposited by Pulsed Laser Deposition

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Authors

KSKimihiko SudohJapan Science and Technology AgencyYIYusuke IchinoAichi Institute of TechnologyMIM. ItohNagoya University

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Sudoh et al. (2002) studied this question.

synapsesocial.com/papers/6aa8528301f841cb98aa9007https://doi.org/10.1143/jjap.41.l983
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