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September 23, 1996Applied Physics Letters

Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes

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Authors

FHFrédéric HouzéUniversité Paris-SudRMR. MeyerUniversity of WürzburgOSOlivier SchneegansUniversité Paris-Sud

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Houzé et al. (1996) studied this question.

synapsesocial.com/papers/6aa8da07eee550b2c7887819https://doi.org/10.1063/1.117179
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