Fluorescence spectra and secondary-ion spectra for laser ablation of high-temperature metal-oxide superconductors are reported. These processes can be used to monitor a thin-film deposition process. The fluorescence spectra are more suitable for Y, Ba, and Ca ions. However, ion spectra can be used to monitor and identify Tl and Ca ions easier than by fluorescence spectra.
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Chen et al. (1988) studied this question.
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