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August 26, 2005Applied Physics Letters

Precise determination of band offsets and chemical states in SiN∕Si studied by photoemission spectroscopy and x-ray absorption spectroscopy

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STSatoshi ToyodaKyoto UniversityJOJun OkabayashiThe University of TokyoHKHiroshi KumigashiraHigh Energy Accelerator Research Organization

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Toyoda et al. (2005) studied this question.

synapsesocial.com/papers/6aadd6f3fc6d9605b2db88a0https://doi.org/10.1063/1.2035894
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