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Optical lithography will reach its limits due to the diffraction effects encountered and the necessity for using complex resolution enhancement techniques like optical proximity correction, phase shift masks, and off-axis illumination [L. W. Liebmann et al., in Advanced Semiconductor Lithography (2001), Vol. 45]. The restrictions on wavelength, in combination with high process and equipment costs, make low-cost, simple imprinting techniques competitive with next-generation lithography methods. There are several nanoimprint lithography (NIL) techniques which can be categorized depending on the process parameters and the imprinting method—either step and repeat or full wafer single-step imprinting. A variety of potential applications has been demonstrated using NIL (e.g., surface acoustic wave devices, vias and contact layers with dual damascene imprinting process, Bragg structures, patterned media) [M. D. Stewart et al., Proc. SPIE 5751, 210 (2005); P. Dorsey et al., in Discrete Track Recording (DTR) Media Fabricated using Nanoimprint Lithography, NNT 1–3 December (2004)]. In this work UV-NIL has been selected for the fabrication process of 3D-photonic crystals.
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Glinsner et al. (2007) studied this question.
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