Ion scattering spectroscopy (ISS) of vacuum deposited Ag on octadecanethiol (ODT, HS(CH2)17CH3) organized molecular assemblies (OMAs) provides a means of studying interfacial structure at metal/organic interfaces under controlled conditions. The OMAs were self-assembled onto gold films on silicon 〈100〉 substrates. ISS compositional depth profiles of the Ag/CH3 interface were performed at a number of temperatures between 113 and 293 K. Results from these experiments show clearly that Ag penetrates rapidly through ODT above ∼200 K. The changes in ISS Ag peak intensities as a function of time and temperature provide evidence for the formation of Ag clusters at the ODT/Au interface after penetration of Ag. Changes in deposition rate between 0.003 and 0.015 nm/s yielded little difference in corresponding ISS depth profiles. Over a range of ion beam current densities from 0.06 to 2.0 μA/cm2, scaled compositional depth profiles were found to be comparable within experimental error.
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Herdt et al. (1994) studied this question.