Diffusion mediated by native point defects does not generally occur in semiconductors at room temperature (RT) because of high activation energies. However, recently observed plastic deformation in AlGaN/GaN structures in the presence of strain and electric fields was attributed to diffusive processes. Here, we report first-principles calculations showing that strain has little effect, but RT mass transport is enabled by near-zero formation energy of triply negative cation vacancies and a concomitant electric-field-induced lowering of migration energy. Similar phenomena are predicted to occur in other large-gap materials.
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Warnick et al. (2011) studied this question.
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