A simulation paradigm is proposed to examine the effects of transistor-level degradation produced by total ionizing dose (TID) on top-level system performance parameters. The approach is demonstrated on a command and data handling (C&DH) board for deep-space CubeSats. Simulation and postirradiation measurements of a temperature control loop show that TID degradation changes temperature regulation significantly.
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Witulski et al. (2019) studied this question.
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