Analysis of Large Particle Count in Fumed Silica Slurries and Its Correlation with Scratch Defects Generated by CMP, Remsen, Edward E., Anjur, Sriram, Boldridge, David, Kamiti, Mungai, Li, Shoutian, Johns, Timothy, Dowell, Charles, Kasthurirangan, Jaishankar, Feeney, Paul
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Remsen et al. (2006) studied this question.
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