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A radical change to the electron source could improve by orders of magnitude the combined spatiotemporal resolution of ultrafast electron microscopy. The authors design and evaluate an instrument featuring a high-brightness MeV electron beam from an rf photoinjector. Being able to take snapshots at 1000 times the formerly highest rate would enable researchers to study nanoscale dynamical processes in real time.
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Li et al. (2014) studied this question.
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