Key result
Epicardial pulsed field ablation (2400V) near a CRT-D generator and LV lead caused transient device reversion to factory settings and an abrupt pacing change from VVI 30/min to DDD 70/min.
Why the study?
Pulsed field ablation is increasingly used, but experience with ventricular and particularly epicardial applications in patients with cardiac implantable electronic devices remains limited.
Case Report (n=1)
No
This first report of transient CRT-D reversion to factory settings during epicardial ventricular pulsed field ablation highlights the risk of clinically relevant PFA-CIED interactions when delivering energy near device generators or leads.
Answers are grounded in this paper and cite their sources.
Caution advised with epicardial pulsed field ablation near device generators; leaves open systematic risk assessment in implanted patients.
Background Pulsed field ablation (PFA) is increasingly used, but experience with ventricular, and particularly epicardial applications in patients with cardiac implantable electronic devices (CIED) remains limited. Case presentation A 49-year-old woman with LMNA- and SCN5A-associated cardiomyopathy, mildly reduced left ventricular ejection fraction (45%), and cardiac resynchronization therapy defibrillator (CRT-D) presented with recurrent ventricular tachycardia (VT) and implantable cardioverter-defibrillator (ICD) shocks. Previous endocardial VT ablation had revealed no relevant endocardial low-voltage substrate. Repeat ablation was performed using a combined endo–epicardial approach. Epicardial mapping identified extensive low-voltage, with the best pace-map match at the basal lateral left ventricle. Ablation was performed using a focal dual-energy catheter with radiofrequency energy up to 40 W and PFA (2400V). Following epicardial PFA in proximity to the device generator and left ventricular lead, pacing abruptly changed from VVI 30/min to DDD 70/min. Initial attempts at device interrogation failed. After communication was restored, interrogation demonstrated that the CRT-D had reverted to factory settings. The device was successfully reset and reprogrammed. Further PFA near the LV lead or generator was avoided. Sensing, pacing thresholds, and lead impedances were preserved. Discussion To our knowledge, this is the first report of a clinically relevant transient CIED malfunction temporally associated with epicardial ventricular PFA using a focal single-tip dual-energy ablation catheter. Although no permanent generator or lead dysfunction occurred, this observation highlights the potential for PFA–CIED interactions beyond conventional PFA workflows and across different catheter technologies.
No takes yet. Share an insight, caveat, or question.
Wahedi et al. (2026) conducted a case report in LMNA- and SCN5A-associated cardiomyopathy with recurrent ventricular tachycardia and CRT-D (n=1). Combined endo-epicardial ablation using a focal dual-energy catheter (radiofrequency and pulsed field ablation) was evaluated on Transient CRT-D malfunction (reversion to factory settings and abrupt pacing change). Epicardial pulsed field ablation (2400V) near a CRT-D generator and LV lead caused transient device reversion to factory settings and an abrupt pacing change from VVI 30/min to DDD 70/min.
Synapse has enriched 10 related papers. Consider them for comparative context: