Storage Life Prediction of High-Voltage Diodes Based on Improved Artificial Bee Colony Algorithm Optimized LSTM-Transformer Framework

High-voltage diodes, as key devices in power electronic systems, have important significance for system reliability and preventive maintenance in terms of storage life prediction. In this paper, we propose a hybrid modeling framework that integrates the Long Short-Term Memory Network (LSTM) and Transformer structure, and is hyper-parameter optimized by the Improved Artificial Bee Colony Algorithm (IABC), aiming to realize the high-precision modeling and prediction of high-voltage diode storage life. The framework combines the advantages of LSTM in time-dependent modeling with the global feature extraction capability of Transformer’s self-attention mechanism, and improves the feature learning effect under small-sample conditions through a deep fusion strategy. Meanwhile, the parameter type-aware IABC search mechanism is introduced to efficiently optimize the model hyperparameters. The experimental results show that, compared with the unoptimized model, the average mean square error (MSE) of the proposed model is reduced by 33.7% (from 0.00574 to 0.00402) and the coefficient of determination (R2) is improved by 3.6% (from 0.892 to 0.924) in 10-fold cross-validation. The average predicted lifetime of the sample was 39,403.3 h, and the mean relative uncertainty of prediction was 12.57%. This study provides an efficient tool for power electronics reliability engineering and has important applications for smart grid and new energy system health management.