Compact spectroscopic ellipsometry system enables accurate thin film property detection without movement.
We demonstrated a compact metasurface array-based spectroscopic ellipsometry system that allows single-shot spectropolarimetric detection and accurate determination of thin film properties without any mechanical movement.
No takes yet. Share an insight, caveat, or question.
Xue et al. (2025) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: