This analysis uncovers the influence of circuit parameters on dynamic avalanche in FS-IGBT, suggesting enhancements through manipulation.
The dynamic avalanche effect is a critical factor influencing the performance and reliability of the field-stop insulated gate bipolar transistors (FS-IGBT). Unclamped inductive switching (UIS) is the primary method for testing the dynamic avalanche capability of FS-IGBTs. Numerous studies have demonstrated that factors such as device structure, avalanche-generating current filaments, and electrical parameters influence the dynamic avalanche effect of the FS-IGBT. However, few studies have focused on enhancing the avalanche reliability of the FS-IGBT by adjusting circuit parameters during operation. In this paper, the dynamic avalanche effect of the FS-IGBT under UIS conditions is comprehensively investigated through a series of comparative experiments with varying circuit parameters, including bus voltage V DC , gate voltage V G , gate resistance R g , load inductance L , and temperature T C . Furthermore, a method to enhance the dynamic avalanche reliability of the FS-IGBT under UIS by optimizing circuit parameters is proposed. In practical applications, reducing gate voltage, increasing load inductance, and lowering temperature can effectively improve the dynamic avalanche capability of the FS-IGBT.
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Zhang et al. (2025) studied this question.
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