Resistive random access memories (ReRAMs) based on an organic-metallic hybrid polymer, Poly(Fe-btpyb) Purple, were fabricated. This material was synthesized by complexation of metal ion and organic ligand. When applying forward bias, an abrupt resistance change from a low resistance state (LRS) to a high resistance state (HRS), which is known as reset process, was observed. In contrast, a reverse bias switched the resistance from HRS to LRS (set process). The resistive switching phenomenon is probably caused by the electrochemical oxidation-reduction reaction of the metal ion (Fe(II)/Fe(III)). The nonvolatile memory characteristics were measured with data-retention tests, showing no significant degradation over 105 s. The endurance characteristics exhibited sufficient long-term durability, due to no conformational change of the organic ligand. It is proposed that the difference in charge-transfer efficiency between the reduced state (Fe(II)) and oxidized state (Fe(III)) might be the physical mechanism of the resistive switching.
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Onojima et al. (2024) studied this question.
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